Electronics Weekly – Analog Devices Wideband RF Synthesizer, Synopsys Circuit Simulation & More

Analog Devices Wideband RF Synthesizer

(Image courtesy of Analog Devices.)

Analog Devices has announced the ADF5356, a 13.6 GHz wideband synthesizer with integrated voltage-controlled oscillator (VCO), for applications such as wireless infrastructure, microwave point-to-point links, electronic test and measurement and satellite terminals.

The ADF5356 generates RF outputs from 53.125 MHz to 13.6 GHz without any gaps in frequency coverage, which allows the device to be used as a multiband synthesizer, thus eliminating the need for multiple band-specific VCOs/synthesizers products and thereby reducing component count, board space, and power. The ADF5356 is specified over the -40°C to +85°C range. It operates from nominal 3.3-V analog and digital power supplies as well as 5-V charge-pump and VCO supplies, and features 1.8-V logic-level compatibility.

Information concerning pricing and availability can be located on Analog Devices’ website.

KLA-Tencor Metrology Systems for Integrated Circuit Devices

(Image courtesy of KLA-Tencor.)

KLA-Tencor has introduced four metrology systems that enable development and high-volume manufacturing of sub-10nm integrated circuit (IC) devices: the Archer 600 overlay metrology system, the WaferSight PWG2 patterned wafer geometry measurement system, the SpectraShape 10K optical critical dimension (CD) metrology system and the SensArray HighTemp 4mm in-situ temperature measurement system.

These systems expand the capability of KLA-Tencor's 5D Patterning Control Solution to support advanced patterning techniques, such as self-aligned quadruple patterning (SAQP) and extreme ultraviolet (EUV) lithography.

The Archer 600 extends imaging-based overlay metrology technology, helping chipmakers achieve sub-3nm overlay error for advanced logic and memory devices.
The WaferSight PWG2 produces wafer stress and shape uniformity data, enabling process tool monitoring and matching for film deposition, anneal, etch and other process modules.
The SpectraShape 10K optical-based metrology system measures the CDs and three-dimensional shapes of complex IC device structures following etch, chemical mechanical planarization (CMP) and other process steps.
Through in-situ measurements, the SensArray HighTemp 4mm wireless wafer provides temporal and spatial temperature information for advanced films processes.

For more information, visit KLA-Tencor’s website.

RS Components Differential Air Pressure Sensors

(Image courtesy of RS Components.)

RS Components has announced the SPD800 series of CMOS technology digital and analogue differential pressure sensors from Sensirion. Targeting high-volume applications, the sensors have been designed to measure the pressure of air and non-aggressive gases and deliver accurate and stable results covering a range of up to +/–500 Pa (+/– 5 millibars or +/– 2 inches of water), even at very low differential pressures.

Available in the SDP800 series are the 4-pin +/–500 Pa SDP800-500PA, and the 4-pin +/– 125Pa SDP800-125PA. As well as offering characteristics including reliability, stability and signal-to-noise ratio, the sensors also feature a two-wire digital interface for connection to microcontrollers. In addition, the Sensirion EK-P5 evaluation kit enables sensor evaluation via PC test software, connected by USB cable.

For more details, visit RC Components’ website.

Synopsys AMS Design for Automotive ICs

)Image courtesy of Synopsys.)

Synopsys has released the latest versions of its HSPICE, FineSim and CustomSim circuit simulation products. The growth in automotive electronics and transition to FinFET process nodes have led to a significant increase in IC design complexity and the need for analysis to validate design robustness across a broad set of design conditions and environment variables.

This release delivers Monte Carlo-based variability analysis and provides reliability analysis capabilities to accelerate AMS verification and enable robust AMS design. The impact of variation is more prominent now due to worsening operating conditions – wider process voltage temperature (PVT) range, lower headroom – driven by automotive applications and FinFETs. Ensuring and verifying design robustness requires Monte Carlo-based variability analysis at multiple levels of design abstraction.

For more information, visit Synopsys’ website.

Tektronix Vector Network Analyzer

(Image courtesy of Tektronix.)

Tektronix has introduced the TTR500 Series USB Vector Network Analyzer. The TTR500 Series includes VectorVu-PC analysis software and a built-in bias tee for testing active devices. Additionally, the TTR500 Series offers a 2-port, 2-path S-parameter VNA for such applications as measuring passive/active components, antennas and matching networks and RF modules. It features specifications including 100 kHz to 6 GHz frequency range, 122 dB dynamic range, less than 0.008 dB trace noise and -50 to +7 dBm output power.

An important feature of the TTR500 is the built-in bias tee that is accessible on both ports and allows for active devices (such as amplifiers) to be DC biased. The bias tee allows for 0 to ± 24 V, and 0 to 200 mA on both ports for active devices. The TTR500 works with any Windows PC or laptop and the VectorVu-PC software provides programmatic support for SCPI commands, including command compatibility with common legacy VNAs for integration into existing test systems.

Detailed schematics are available on Tektronix’s website.

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