EW - Testing Edition - AMETEK Force Tester, Keysight Parametric Analysis & More

AMETEK Force Tester

(Image courtesy of AMETEK.)

AMETEK has introduced the CS2 Series of force testing machines for tensile and compression testing up to 5 kN (1124 lbf). These force testing machines are suitable for testing a wide range of materials such as plastics, medical devices, automotive, electronics, textiles and pharmaceuticals. CS2 Series testing machines are available in a 1 kN (225 lbf) and a 5 kN (1124 lbf) frame capacity.

Both single-column force testers feature a 2-in-1 laptop console with a user-friendly 9” touch screen for use in production environments. The laptop comes with a user interface that is designed to be easy to use, regardless of the skill level of the operator. A few touches are all it takes to set up a test, select runs and generate reports.

Additional technical specifications are available on AMETEK’s website.

Hioki Lux Meter

(Image courtesy of Hioki.)

Hioki has launched the FT3425 Lux Meter. Lux meters are used to measure illuminance, and the FT3425 incorporates Bluetooth wireless technology to enhance that core functionality. Used in combination with GENNECT Cross (Hioki’s free smartphone app), the instrument allows users to test illuminance, record results and create reports, speeding up the measurement and reporting process.

The FT3425 can measure illuminance levels ranging from 0.00 lux to 200,000 lux. Consequently, it can be used to measure the low illuminance of emergency exit and evacuation signage as regulated by the Fire Service Act. In addition, the instrument can be used to measure lighting in healthcare facilities (examination and testing spaces as well as operating rooms) where high illuminance of around 100,000 lux is required. It can also be used to measure LED lighting, which has become increasingly common recently.

Information concerning pricing and availability can be found on Hioki’s website.

Keysight Parametric Testing and Analysis

(Image courtesy of Keysight.)

Keysight has announced the third generation of its P9000 series massively parallel parametric test system. The system accelerates the ramp of new technology and reduces the cost-of-test in the development and manufacturing of semiconductor logic and memory ICs. For instance, with the new types of device structure and higher performance, the required amount of parametric test data per advanced technology node (less than or equal to 20 nm) is increasing across the field.

With the introduction of the third generation of P9000 – incorporating the per-pin parametric test module, the P9015A – the tester has shortened the time of capacitance measurements to address the trend of increasing test volumes of capacitance due to multi-layer interconnection and device structure. The module enables the measurement of leaky capacitance by using its DCM technology and enables greater single capacitance measurement with data correlation for various type of capacitance (compared to conventional LCR meters).

For more information, visit Keysight’s website.

Rohde & Schwarz Certified eCall Testing

(Image courtesy of Rohde & Schwarz.)

Rohde & Schwarz (RS) has launched its eCall testing service. From April 1, 2018 onward, car manufacturers are required to equip new vehicles for sale in the EU with an eCall module. In the event of a serious accident, this emergency call system automatically sends data to the uniform European emergency phone number 112 to facilitate faster response by emergency services.

The independent test house CETECOM has certified the eCall test solution from RS, which can be used to simulate a public safety answering point, in accordance with the EN standard. This is intended to put manufacturers and suppliers in a good position for acceptance tests of their installed emergency call systems, and the Russian emergency call counterpart ERA-Glonass can also be tested with an extension.

For more information, visit RS’s website.

XJTAG Flying Probe and Boundary Scan System

(Image courtesy of XJTAG.)

XJTAG and Systech Europe have announced the availability of an integrated testing solution using XJTAG boundary scan and Systech Europe’s flying probe system. With many devices now being manufactured in BGA or fine pitched leaded packaging, the need to have boundary scan to control these devices is necessary to achieve the best coverage.

Furthermore, being able to use flying probes to reach parts of the circuit with no JTAG access allows boundary scan testing to achieve maximum coverage. The integration allows test engineers to shorten test cycle times by optimising the number of probe movements carried out by the flying probe machine. In addition, test coverage is increased by combining the physical access facilitated by the flying probes with XJTAG’s ability to control the boundary scan technology built into many of today’s processors and FPGAs to manipulate the signals on those devices.

Additional information is available on XJTAG’s website.

Missed the last EW – Testing Edition? Click here.